CUSUM Control Charts for the Monitoring of Zero‐inflated Binomial Processes

Zero‐inflated probability models are used to model count data that have an excessive number of zeros. These models are mostly useful in modeling high‐yield or health‐related processes. The zero‐inflated binomial distribution is an extension of the ordinary binomial distribution that takes into account the excess of zeros. In this paper, one‐sided cumulative sum (CUSUM)‐type control charts are proposed for monitoring increases or decreases in the parameter p of a zero‐inflated binomial process. The results of an extensive numerical study concerning the statistical design of the proposed schemes as well as their practical implementation are provided. Copyright © 2015 John Wiley & Sons, Ltd.     

Monitoring the Coefficient of Variation Using the Side Sensitive Group Runs Chart

Many quality characteristics have means and standard deviations that are not independent. Instead, the standard deviations of these quality characteristics are proportional to their corresponding means. Thus, monitoring the coefficient of variation (CV), for these quality characteristics, using a control chart has gained remarkable attention in recent years. This paper presents a side sensitive group runs chart for the CV (called the SSGR CV chart). The implementation and optimization procedures of the proposed chart are presented. Two optimization procedures are developed, i.e. (i) by minimizing the average run length (ARL) when the shift size is deterministic and (ii) by minimizing the expected average run length (EARL) when the shift size is unknown. An application of the SSGR CV chart using a real dataset is also demonstrated. Additionally, the SSGR CV chart is compared with the Shewhart CV, runs rules CV, synthetic CV and exponentially weighted moving average CV charts by means of ARLs and standard deviation of the run lengths. The performance comparison is also conducted using EARLs when the shift size is unknown. In general, the SSGR CV chart surpasses the other charts under comparison, for most upward and downward CV shifts. Copyright © 2015 John Wiley & Sons, Ltd.     

On the Modelling and Monitoring of General Inflated Poisson Processes

In this work, we propose and study general inflated probability distributions that can be used for modelling and monitoring unusual count data. The considered models extend the well‐known zero‐inflated Poisson distribution because they allow the excess of values, other than zero. Four simple upper‐sided control schemes are considered for the monitoring of count data based on the proposed general inflated Poisson distributions, and their performance is evaluated under various out‐of‐control situations. The usefulness of the considered models and techniques is illustrated via two real‐data examples, while practical guidelines are provided as well. Copyright © 2015 John Wiley & Sons, Ltd.     

A short note on the effect of sample size on the estimation error in Cp

Process capability indices such as C_p are used extensively in manufacturing industries to assess processes in order to decide about purchasing. In practice, the parameter for calculating C_p is rarely known and is frequently replaced with estimates from an in-control reference sample. This article explores the optimal sample size required to achieve a desired error of estimation using absolute percentage error of different C_p estimates. Moreover, some practical tools are created to allow practitioners to find sample size in different situations.     

孔网参数测量技术在矿山爆破中的应用

工程中发现爆破效果不稳定,具有偶然误差的特点,从爆破设计和施工中查找原因。以泰玛士矿爆破实践为例,采用激光扫描仪和钻孔测斜仪,测出代表台阶面和钻孔轨迹的空间点坐标,研究钻孔与自由面、钻孔与钻孔之间的空间关系,通过三维图形软件计算真实的爆破参数,优化设计,指导施工,可以取得稳定的爆破效果。结果表明:爆破设计和施工中的钻孔偏移普遍存在,它是导致爆破设计参数失真、爆破效果不稳定的主要因素;控制偏移误差的发生及其负面影响,孔网参数测量是技术支撑,工作程序是技术应用的规范;根据孔网参数测量数据分析发生钻孔偏移的具体原因,针对性解决问题并预防错误重复发生。     

一种测量透明平行平板折射率的新方法

通过测量激光细光束经平行平板玻璃所产生的位移,可确定平行平板的的折射率。本文阐述了该方法的测量原理,给出了测量公式,并详细分析了测量误差。计算机模拟计算结果表明,当平板厚度为50mm时,如果入射角测量标准偏差为1”,平板厚度和光线位移量测量标准偏差均为0.001mm,则折射率测量的标准偏差可达6×10~(-5),此时入射角约55°。     

磁罗盘姿态解算及误差补偿

详细介绍了磁罗盘的姿态解算原理,并分析了造成磁罗盘解算误差的主要因素,提出了基于最小二乘的36位置法,重点对其中的罗差以及制造误差中的零位误差和灵敏度误差进行了补偿修正;并用项目试验验证得出:当只进行零位误差和灵敏度误差修正时,磁罗盘的偏航角解算误差最大可达3°;而经过罗差补偿后,磁罗盘的偏航角解算误差可控制在0.5°以内;实验结果表明,经过补偿后,磁罗盘的解算精度明显提高,且成本低,使用简便,适用范围广。     

On the design of compensator for quantization-caused input-output deviation

This paper considers the design of compensators for systems with quantized inputs in order to reduce the influence of quantization.For systems with (vector) relative degrees,we propose a kind of compensators which can compensate for the accumulated output deviation completely caused by quantization.The proposed compensators are capable of keeping the differences of the input-output responses between the systems with quantized inputs and the original systems without considering quantization within certain sm...     

Identification and optimization of key process parameters in noncontact laser scanning for reverse engineering

This Extended Technical Note shows that the final accuracy level of reverse engineered surfaces depends on scanning distance and scanning angle of the laser beam, hence it also depends on the morphology of the scanned objects. On scanning strongly curved objects, such as the ones with free form surfaces, the distance and impact angle of the laser beam are changing continuously during the scanning process. On the basis of these, two critical parameters are specified for the design model, which make it possible to predict these two factors in advance, depending on the morphology of the scanned object. First, a mathematical-statistical design model of the scanning process is generated, which relies on ANOVA (analysis of variance) and DOE (design of experiments). In the next step, a fitness function is optimized by the genetic algorithm (GA) program. This optimization improves the accuracy of the final scanned surfaces, in terms of the minimum standard deviation values of reverse engineered 3D surface model. The proposed approach was confirmed in a case study, which is presented at the end of this Technical Note.     

回归测试中基于值谱比较的偏离根定位法

在回归测试中,利用程序谱中的值谱比较不同版本程序的内部行为,将程序的比较转换为函数状态的比较,以估计偏离发生的大概位置,找到偏离根所在的函数。引入偏离调用树记录发生偏离的函数,在此基础上提出2种缩小偏离根定位范围的启发式方法,使偏离根的定位更精确。